Electronic Inspection Systems
SPICA Thermography System
Raise the efficiency of your production
With the SPICA system Intego offers a highly sensitive laboratory system for thermography. The system is based on the SPICA IR camera﹐ which has been specially developed by INTEGO for inspection and measurement tasks and allows fast and non-destructive inspection and localization of defects. The measurement technology and automation can be individually adapted to the different requirements of the production process.
Specifications
Passive﹐ lock-in and pulse-phase thermography
Intego Spica 640﹐ Intego Spica 1280 or uncooled IR bolometer camera
wavelength: 3 µm – 5 µm or 7 µm – 14 µm
Up to 6 different IR lenses for various spatial resolutions
Automated lens change
Large field-of-view up to 260 mm x 210 mm (larger on request possible
Spatial resolution down to 1 µm/px
Many different excitation sources:
Electrical: various DC power supplies up to 440 A and up to 10 kV
Optical: flash light﹐ halogen lamp﹐ laser
Other: induction﹐ hot air﹐ ultrasonic
Measurement time from seconds to minutes
Performance data
The system is especially designed for use in research and development and can be flexibly adapted to different fields of application. Of course﹐ the measuring principle can also be transferred to an inline application.
With the SPICA system Intego offers a highly sensitive laboratory system for thermography. The system is based on the SPICA IR camera﹐ which has been specially developed by INTEGO for inspection and measurement tasks and allows fast and non-destructive inspection and localization of defects. The measurement technology and automation can be individually adapted to the different requirements of the production process.
Specifications
Passive﹐ lock-in and pulse-phase thermography
Intego Spica 640﹐ Intego Spica 1280 or uncooled IR bolometer camera
wavelength: 3 µm – 5 µm or 7 µm – 14 µm
Up to 6 different IR lenses for various spatial resolutions
Automated lens change
Large field-of-view up to 260 mm x 210 mm (larger on request possible
Spatial resolution down to 1 µm/px
Many different excitation sources:
Electrical: various DC power supplies up to 440 A and up to 10 kV
Optical: flash light﹐ halogen lamp﹐ laser
Other: induction﹐ hot air﹐ ultrasonic
Measurement time from seconds to minutes
Performance data
The system is especially designed for use in research and development and can be flexibly adapted to different fields of application. Of course﹐ the measuring principle can also be transferred to an inline application.
