賢昇科技 KENSHO:首頁

X-RAY Inspection
X-Ray Inspection SMX-31M/FI-30M 微焦點X-Ray透視檢查裝置
M Series High-Capacity X-RAY
Fluoroscopy Inspection System

•Used for parts such as electronic components and die cast components
•Wide range of observations possible (9 inch I.I.)
•Optimum position of view through 5-axis control
•Wide easy-to-view monitor screen

•適用於電子零件和壓鑄零件
•觀察範圍廣(9英寸I.I.)
•擁有5軸任意位置的透視操作
•易視寬螢幕監控畫面